"Patent Evaluation Based on Technological Trajectory Revealed in Relevant Prior Patents"

Cover Advances in Knowledge Discovery and Data Mining

Author(s): 

Sooyoung Oh, Zhen Lei, Wang-Chien Lee and John Yen

Citation: 

In Advances in Knowledge Discovery and Data Mining: 18th Pacific-Asia Conference, PAKDD 2014, Tainan, Taiwan, May 13-16, 2014, Proceedings, Part I, eds. Vincent S. Tseng, Tu Bao Ho, Zhi-Hua Zhou, Arbee L. P. Chen and Hung-Yu Kao; (New York, NY: Springer, Lecture Notes in Artificial Intelligence 8443, 2014), pp. 545-556