A Probabilistic Bio-economic Assessment of the Global Consequences of Wheat Leaf Rust

Cover Phytopathology

Author(s): 

Yuan Chai, Philip G. Pardey, Terrance M. Hurley, Senait Senay and Jason M. Beddow

Citation: 

Phytopathology 110 (12) (December 2020): 1886-1896
** awarded Editor’s Pick from the December issue

Linked File: 

Abstract